In the field of materials, scanning electron microscopy technology plays an extremely important role and is widely used in the study of the morphology, interface condition, damage mechanism, and material performance prediction of various materials.

Scanning electron microscopy can be used to directly study crystal defects and their production processes, observe the aggregation mode of atoms inside metal materials and their true boundaries, observe the movement of boundaries under different conditions, and examine the damage and radiation damage caused by crystal surface machining. We can provide professional solutions for materials such as composite materials, ceramics, fibers, films, metals, alloys, polymers, and plastics.

In the field of electronic semiconductors, scanning electron microscopy technology has important application value in chip manufacturing, nanotechnology, and optoelectronic devices.

By using scanning electron microscopy, high-precision surface analysis, defect identification and quantification of semiconductor materials can be performed, thereby improving the performance and reliability of semiconductor devices. We provide professional solutions for the field of electronic semiconductors, covering multiple research directions such as chip manufacturing, packaging, fault analysis, material characterization, and nanotechnology.